Course Objective & Scope
In industrial quality inspection and equipment/system fault diagnostics, defective samples are scarce and novel defect modes appear without warning. This programme covers normal-only visual and signal anomaly localisation (PatchCore, PaDiM, Reverse Distillation with Anomalib), supervised defect detection and pixel segmentation (YOLO, U-Net), and 1D-CNN/temporal autoencoder models for high-frequency vibration, acoustic and sensor waveforms.
Robustness to lighting and fixture shifts, synthetic defect generation (CutPaste/diffusion), image- and pixel-level AUROC/AUPRO metrics and line-speed edge inference are practised hands-on. Participants build an end-to-end defect detection and localisation prototype on an inspection or fault dataset.
Who Should Attend?
- Data scientists and ML engineers in manufacturing, automotive, electronics, textiles and energy
- Visual quality inspection, non-destructive testing (NDT) and automation engineers
- R&D teams diagnosing faults from sensor waveforms, acoustics and system logs
- Prerequisite: Python and foundational deep learning experience in PyTorch
Key Takeaways
- Train normal-only visual defect localisation models with Anomalib (PatchCore, PaDiM) to produce pixel heatmaps
- Build supervised object detection (YOLO) and segmentation (U-Net) pipelines for catalogued defect classes
- Detect mechanical and electrical faults from vibration and acoustic waveforms using spectrograms, 1D-CNNs and autoencoders
- Augment scarce defect classes via CutPaste and synthetic defect injection
- Calibrate pass/fail thresholds against false-scrap and escaped-defect costs at production line speeds
Curriculum
Industrial Defect and Fault Formulations
- Supervised defect classification/segmentation vs normal-only (one-class) learning
- Visual surface defects, waveform faults and log-sequence failures
Visual Defect Localisation: PatchCore, PaDiM and Anomalib
- Pretrained backbone patch features, coreset memory banks and Mahalanobis scoring
- Pixel-level anomaly heatmaps and AUPRO/AUROC evaluation
Supervised Detection, Segmentation and Synthetic Defects
- High-resolution tiling, YOLO and U-Net for tiny surface defects
- CutPaste and synthetic defect blending for rare-class augmentation
Acoustic, Vibration and Log-Sequence Fault Detection
- 1D/2D CNNs and TCNs on raw waveforms and Mel-spectrograms
- LSTM/Transformer Autoencoders and DeepLog for sequence faults
Calibration, Sensor Shift and Line-Speed Deployment
- Handling lighting/batch shifts and controlling false-reject (overkill) rates
- Millisecond inline inference with ONNX and TensorRT
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